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UID:20250919T025233EDT-62380G1Rbn@132.216.98.100
DTSTAMP:20250919T065233Z
DESCRIPTION:Instructors\n\nMain Instructor: Prof. Pierre-Luc Girard-Lauriau
 lt\, Department of Chemical Engineering\n\nCo-Instructors: Prof. Raynald G
 auvin and Prof. Marta Cerruti\, Department of Mining and Materials Enginee
 ring\n\nInstructor Biography: Prof. Girard-Lauriault is part of the Plasma
  Processing Laboratory and conducts research on the development of plasma 
 prepared thin organic coatings aimed at biomedical applications.  During b
 oth his doctoral\, at École Polytechnique\, in Montreal (Canada)\, and pos
 t-doctoral\, at the federal institute for materials research and testing\,
  in Berlin (Germany) studies he has used and developed an array of surface
  analysis techniques to understand the chemistry and morphology of complex
  plasma polymer surfaces as well as their influences on the interactions w
 ith living cells.\n\n Workshop Schedule\n\nThe workshop aims at providing 
 the participants with a sufficient understanding of the principles of surf
 ace characterization in order for them to be able to prepare a tailored ch
 aracterization strategy to answer their own research questions. It is divi
 ded in two parts:\n\nFirst\, a lecture (4h) that will cover the following 
 points:\n\n\n	An overview of the field of Surface Characterization and a de
 scription of its basic principles and considerations.\n	A presentation and 
 comparison of the main surface characterization techniques by focusing on 
 i) technique working principles ii) information obtained iii) important pr
 actical experimental considerations iv) usefulness for sensor technologies
 .\n	A more detail presentation of X-Ray Photoelectron Spectroscopy (XPS)\, 
 Scanning Electron Microscopy (SEM) and Raman Spectroscopy.\n\n\nFollowing 
 the lecture\, the participants will take part in a practical workshop (1.5
  days) where several surface characterization techniques (X-Ray Photoelect
 ron Spectroscopy\, Scanning Electron Microscopy\, Raman spectroscopy\, Sur
 face Plasmon Resonance Spectroscopy and Confocal Microscopy) will be used 
 to analyze relevant samples.\n\n Workshop Summary\n\nSensor technologies a
 re often based on physical or chemical processes that occur at a surface/i
 nterface.  The capacity to characterize and understand the surface propert
 ies of materials is therefore a critical success parameter for the develop
 ment or refinement of a particular sensor application.  The surface is an 
 elusive entity defined by the first atomic layers of a material\, which ar
 e generally different than those in the bulk material underneath.  The sel
 ective analysis of this thin layer of material is a significant challenge\
 , which defines its own field: Surface and Interface Analysis\, a combinat
 ion of principles\, techniques and strategies which allow the gathering of
  information about the surface of materials.\n\nSpace is limited\, therefo
 re ISS graduate students and undergraduates will have priority.  Free spot
 s will be allotted on a first come first serve basis\, and all non ISS stu
 dents will be added to the waitlist.\n\nCost and Registration\n\nDeadline 
 to register: January 15\, 2016\n\nThe cost of the workshop is $280.00 plus
  taxes.  For all ISS participants who register and show up\, the fee will 
 be waived. Cancellations should made at least 24 hours in advance or the p
 articipant will be charged the full cost of the workshop. Spots will be al
 lotted on a first come first serve basis.\n\nTo register\, click here\n
DTSTART:20160125T150000Z
DTEND:20160126T230000Z
LOCATION:Room 7130\, Wong Building\, CA\, QC\, Montreal\, H3A 0C5\, 3610 ru
 e University
SUMMARY:ISS Surface and Material Characterization Workshop
URL:/miam/channels/event/iss-surface-and-material-char
 acterization-workshop-255177
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